Vinsamlegast notið þetta auðkenni þegar þið vitnið til verksins eða tengið í það: http://hdl.handle.net/1946/35490
Magnetic behaviour of five bi-layer V2O3/Ni thin film samples sputtered on sapphire, Al2O3, were investigated using MOKE (magneto-optic Kerr effect). Three samples show a fourfold symmetry in coercivity with
very small but similar change in magnetic remanence. For comparison micromagnetic simulations were done in Mumax3. The samples have a well defined growth direction, , so simulations were setup to replicate
this. Nickel is a cubic crystal with easy axes <111>, hard axes <100> and medium axes <110>. In the simulations an external magnetic field was applied and then rotated in-plane as was done in the MOKE
measurements. The result are hysteresis loops as a function of azimuthal angle yielding the normalized magnetic remanence and coercive field. This was done for two sample sizes with number of cells in x-, yand
z- direction 128x128x2 and 256x256x2 both having cell size 4x4x10nm. The results did not change when sample size was increased. These simulations were done both for growth direction  and  out of plane. Quantitatively the results from simulations agree with magneto-crystalline energy for nickel, both when rotated around  and , showing a sixfold and fourfold symmetry respectively. The measured
samples don’t show this sixfold symmetry.