<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-10-02T03:13:44Z</responseDate><request verb="GetRecord" identifier="oai:skemman.is:1946/47157" metadataPrefix="dim">https://skemman.is/oai/request</request><GetRecord><record><header><identifier>oai:skemman.is:1946/47157</identifier><datestamp>2024-05-21T10:42:09Z</datestamp><setSpec>com_1946_2064</setSpec><setSpec>com_1946_2057</setSpec><setSpec>col_1946_2107</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:doc="http://www.lyncode.com/xoai" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
<dim:field mdschema="dc" element="contributor" lang="is">Háskóli Íslands</dim:field>
<dim:field mdschema="dc" element="contributor" qualifier="author">Hálfdán Ingi Gunnarsson 2002-</dim:field>
<dim:field mdschema="dc" element="description" qualifier="advisor">Snorri Þorgeir Ingvarsson 1967-</dim:field>
<dim:field mdschema="dc" element="description" qualifier="abstract" lang="is">Tilgangur þessarar ritgerðar er að skoða aðferðir til að mæla misátta eðlisviðnám í þunnum húðum. Skoðaðar eru aðferðirnar: Aðferð Montgomery, aðferð Price og aðferð Kleiza. Þær byggjast allar á fjögurra punkta mælingu van der Pauw, sem er mikið notuð í hálfleiðara tækni. Niðurstöður aðferðanna eru metnar fyrir fimm mismunandi sýni, þrjú einsátta og tvö misátta permalloy sýni. Ýmsir gallar fylgja notkun aðferðanna, til dæmis hafa aðferðirnar tiltölulega háa óvissu sem kemur frá lengdarmælingunum. Áhrif staðsetningar fimmta snertiskeytisins í aðferð Kleiza er skoðuð og hentugasta staðsetningin er fundin til að vera miðja lengri hliðarinnar. Ætlunin er að sjá hvort hægt er að nota þessar aðferðir til að skoða meðal annars áhrif segulhrifa á viðnámsmisáttun. Hins vegar virðast þessar aðferðir ekki vera hentugar til að skoða seguláhrif vegna þess að forsendur aðferðanna gætu verið brostnar í segulsviði.</dim:field>
<dim:field mdschema="dc" element="description" qualifier="abstract" lang="en">The purpose of this thesis is to review methods for measuring anisotropic resistivity in thin films. The methods reviewed here are: Montgomery's method, Price's method, and Kleiza's method. They are extended versions of the van der Pauw's four-point measurements commonly used in the semiconductor industry. The methods are applied to the measurements of five samples, three isotropic and two anisotropic permalloy thin films. This is done to determine the reliability of the methods. Various drawbacks follow the use of the methods, such as the methods have a relatively high uncertainty that originates in the length measurements. The effect of the location of the fifth contact in Kleiza's method is examined, and the most suitable location is determined to be the middle of the sample's longer side. The intention is to see if these methods can be used to measure, among other things, the effect of magnetism on anisotropic resistivity. However, these methods do not seem suitable for examining magnetism, as the assumptions of the methods might be flawed when a magnetic field is applied to them.</dim:field>
<dim:field mdschema="dc" element="date" qualifier="accessioned">2024-05-21T10:42:08Z</dim:field>
<dim:field mdschema="dc" element="date" qualifier="available">2024-05-21T10:42:08Z</dim:field>
<dim:field mdschema="dc" element="date" qualifier="issued">2024-05-21T10:42:09Z</dim:field>
<dim:field mdschema="dc" element="date" qualifier="submitted">2024-05-20T13:46:52Z</dim:field>
<dim:field mdschema="dc" element="date" qualifier="published">2024-05</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1946/47157</dim:field>
<dim:field mdschema="dc" element="language" qualifier="iso">is</dim:field>
<dim:field mdschema="dc" element="subject" lang="is">Eðlisfræði (námsgrein)</dim:field>
<dim:field mdschema="dc" element="subject" lang="is">Eðlisviðnám</dim:field>
<dim:field mdschema="dc" element="title" lang="is">Um aðferðir til að mæla misáttun eðlisviðnáms í þunnum húðum</dim:field>
<dim:field mdschema="dc" element="title" lang="en">On methods to measure anisotropic resistivity in thin films</dim:field>
<dim:field mdschema="dc" element="type">Thesis</dim:field>
<dim:field mdschema="dc" element="type" qualifier="degree">Bachelor's</dim:field>
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